Fuzzy Approach for Reliability Modeling of Lead-Free Solder Joints in Elevated Temperature Environmental Conditions
نویسندگان
چکیده
The mechanical and fatigue properties of microelectronic interconnection materials are important issues in critical applications the life electronic assemblies. Due to growth components new technological products used tough conditions, evaluating reliability solder alloys has become crucial prediction product life. SAC (Sn-Ag-Cu) common lead-free form joints. In current study, individual SAC305 joints actual setting conditions with an organic solderability preservative (OSP) surface finish was examined using accelerated shear test at different load levels (16 MPa, 20 24 MPa). Four operating temperature (−10, 25, 60, 100 °C) were also used. Seven samples utilized each experimental condition. An orthogonal array (L12) employed for this experiment. behavior described by a two-parameter Weibull distribution. characteristic shape parameter extrapolated from distribution Characteristic represent resistance For sample, inelastic work per cycle plastic deformation determined. results indicated notable increase strain as result increasing either stress or working temperature. Combinations amplitude, temperature, work, applied inputs fuzzy system computing comprehensive output measure (COM-Value) Mamdani method. A negative relationship observed between four inputs. To fuzzify system, two membership functions, “MFs”, formed input, five MFs set output. center-of-gravity (COG) theorem defuzzification method inference system. predicted COM-Value, which independent variable. Finally, COM-Value generate general model acceptable adequacy index.
منابع مشابه
Thermal Cycling Reliability of Chip Resistor Lead Free Solder Joints
The solder joint reliability of ceramic chip resistors assembled to laminate substrates has been a long time concern for systems exposed to harsh environments such as those found in automotive and aerospace applications. This is due to a combination of the extreme temperature excursions experienced by the assemblies along with the large coefficient of thermal expansion mismatches between the al...
متن کاملMeasurement Note - Crack Detection Methods For Lead-free Solder Joints
This Note describes the suitability of a number of techniques of potential use in studying cracking in lead-free solder joints, and hence their use in assessing joint lifetimes. Cracks induced into solder joints of chip resistors on FR4 substrates, were studied using micro-sectioning, dye penetration, mechanical test and thermal conductivity techniques. The work previously reported [1] has been...
متن کاملThermal Fatigue Assessment of Lead-Free Solder Joints
In this paper the authors have investigated the thermal fatigue reliability of lead-free solder joints. They have focused their attention to the formation of the intermetallic compound and its effect on the initiation and propagation behaviors of fatigue cracks. Furthermore, they also studied the effect of voids in the solder joints on the fatigue reliability. An isothermal fatigue test method ...
متن کاملPb-Free High Temperature Solder Joints for Power Semiconductor Devices
Three types of inexpensive Pb-free solder joints, namely Zn-based and Bi-based solders, and a CuSn alloy were studied for application to the high-temperature operation of wide band-gap power semiconductor devices using GaN or SiC. Zn– Al solder sheets, whose melting point is 380°C were prepared, and then surface oxides were removed by RF plasma etching. Subsequently, Cu thin films were deposite...
متن کاملSolder Joints in Electronics: Design for Reliability
The emerging new technologies provide ever more challenges to assure the reliability of electronic products. The ever increasing demands in electronic products for higher performance, lower cost, less space (weight) is leading to ever denser interconnection needs. This makes solder joint reliability an even more important issue with the advent of new surface mount packages and the use of surfac...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Crystals
سال: 2022
ISSN: ['2073-4352']
DOI: https://doi.org/10.3390/cryst12060775